GUARANTEE - In compliance with legislation, the manufacturer’s guarantee is valid from the date stamped on the product and is restricted to the

repair or free replacement of the parts accepted by the manufacturer as being defective due to poor quality materials or manufacturing defects. The

guarantee does not cover damage or defects caused by external agents, faulty maintenance, overloading, natural wear and tear, choice of incorrect

product, assembly errors, or any other cause not imputable to the manufacturer. Products that have been misused will not be guaranteed or repaired.

By the dip switch 1 of the receiver it is possible to select if the device test must be carried out with a high logic signal (so the test will activate itself if

between the terminals TEST1 and TESTC will be present a tension from 10V dc to 24 Vdc) or with a low logic signal (so the test will activate itself if

between the terminals TEST1 and TESTC will be present a tension of 0Vdc). In this case, the test will be for the device memorized to the relay 1. The

same is for TEST2 and TESTC for the device memorized to the relay 2.

During this test, the receiver sends a signal to all the associated transmitter with the request of their state. If all the devices answer positively, the test

is passed and the correspondent relay (which was previously open) re – closes itself.

With the dip 1 of the receiver on OFF position: the test of the device is executed by applying a high logic signal 10-24 Vdc at the input.

With the dip of the receiver on ON position: the test of the device is executed by applying a low logic signal 0 Vdc at the input.